Step 44. Contact photo

 

 

 

 

Step

 

Process

Date

Operator

 

44.1

 

 

Std. DUV litho with BARC.

Mask: 2nd modified CONT mask
Focus-energy matrix on test wafer
40mJ, -0.35um

Note1: Use higher energy to surely open up small (0.5um) contacts. This time 0.7um looks good.

Note2: Check PM marks and put down new ones before developing if they look worn out.

Oven bake for 1.5 hours @ 120C. (UVBAKE is down)

 


11/19/04

Horvath