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Run Card for cmos150 |
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Step 43.0 |
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Process: Testing: 1.0 μm N-channel and P-channel devices on autoprobe in DCL. |
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Operator |
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Note: wafer #8 was broken, but some portion of the pieces was big enough to test. |
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Transistor: Mn10x1.0Catastrophic
Failure Test: Transistors Tested: 17, Failed: 5
No
catastrophic failure: 12
Short
on Gate: 4
Open
on Source or Drain: 1
Threshold
Voltage:
VBS: 0 NoTrn: 12 mean: 0.837 V stddev: 0.00634 |
5/5/2002 |
vorosl |
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Transistor: Mp10x1.0Catastrophic Failure Test: Transistors Tested: 17, Failed: 6 No catastrophic failure: 11 Short on Gate: 4 Short between Drain & Source: 1 Open on Source or Drain: 1 Threshold Voltage: VBS: 0 NoTrn: 11 mean: -0.562 V stddev: 0.03421 |
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